Fault Analysis in Cryptography by Marc Joye, Michael Tunstall
English | PDF (True) | 2012 | 352 Pages | ISBN : 3642296556 | 6.9 MB
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks.
