This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

One of the main problems in chip design is the huge number of possible combinations of individual chip elements, leading to a combinatorial explosion as chips become more complex. New key results in theoretical computer science and in the design of data structures and efficient algorithms, can be applied fruitfully here. The application of ordered binary decision diagrams (OBDDs) has led to dramatic performance improvements in many computer-aided design projects. This textbook provides an introduction to the foundations of this interdisciplinary research area with an emphasis on applications in computer-aided circuit design and formal verification.

An Experimental Approach to CDMA and Interference Mitigation was written with the admittedly ambitious intent of filling the gap between communication theory and VLSI implementation, and thus to provide a more general/theoretical approach to the design, development, and testing of a CDMA receiver. As a consequence, the concepts and techniques that are presented turn out to be applicable to a more general kind of digital wireless modems in terms of receiver architecture design and implementation.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created. In our approach, we ensure that cross-talk is eliminated by design. The work described in this book attempts to take an "outside-the-box" view and propose a radically different design style. This design style first imposes a fixed layout pattern (or fabric) on the integrated circuit, and then embeds the circuit being implemented into this fabric. The fabric is chosen carefully in order to eliminate the cross-talk problem being faced in modem IC processes. With our choice of fabric, cross-talk between adjacent wires on an IC is reduced by between one and two orders of magnitude. In this way, the fabric concept eliminates cross-talk up-front, and by design. We propose two separate design flows, each of which uses the fabric concept to implement logic. The first flow uses fabric-compliant standard cells as an im­ plementation vehicle. We call these cells fabric cells, and they have the same logic functionality as existing standard cells with which they are compared.

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

This book is a collection of high-quality peer reviewed contributions from the academicians, researchers, practitioners, and industry professionals, accepted in the International Conference on Advances in Data Computing, Communication and Security (I3CS2021) organized by the Department of Electronics and Communication Engineering in collaboration with the Department of Computer Engineering, National Institute of Technology, Kurukshetra, India during 08-10 Sep 2021. The fast pace of advancing technologies and growing expectations of the next-generation requires that the researchers must continuously reinvent themselves through new investigations and development of the new products. The theme of this conference is devised as "Embracing Innovations" for the next-generation data computing and secure communication system.

This book presents select proceedings of the International Conference on Micro and Nanoelectronics Devices, Circuits and Systems (MNDCS-2022). The book includes cutting-edge research papers in the emerging fields of micro and nanoelectronics devices, circuits, and systems from experts working in these fields over the last decade. The book is a unique collection of chapters from different areas with a common theme and is immensely useful to academic researchers and practitioners in the industry who work in this field.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.